Draft Details

IEC 61987, part 41: Generic structures of list of properties (LOP) of process analyzer technology (PAT) measuring devices for electronic data exchange

Number:prEN IEC 61987-41:2024

Committee:CLC/TC 65X

Review end date:19 Apr 2024

This draft is no longer available to be viewed. The comments that have been made on it have been collected, and will be considered by the committee responsible for the draft.