Information sciences.

IEC 61987-41 ED1 - IEC 61987, Part 41: Generic structures of List of Properties (LOP) of Process Analyzer Technology (PAT) measuring devices for electronic data exchange
Categories: Documents
Committee: IEC/TC 65 (Industrial-process measurement, control and automation)
Origin: IEC
Close date: 19 Apr 2024
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prEN IEC 61987-41:2024 - IEC 61987, part 41: Generic structures of list of properties (LOP) of process analyzer technology (PAT) measuring devices for electronic data exchange
Categories: Documents
Committee: CLC/TC 65X (error)
Origin: CENELEC
Close date: 19 Apr 2024
Draft Details
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