Testing
Categories:
Testing. Electrical and electronic
Committee: CLC/TC 66X
("Safety of measuring)
Origin: CENELEC
Close date: 16 Oct 2026
Categories:
Testing. Non-destructive
Committee: ISO/TC 135/SC 2
(Surface methods)
Origin: ISO
Close date: 02 Nov 2026
Categories:
Testing. Non-destructive
Committee: ISO/TC 135/SC 2
(Surface methods)
Origin: ISO
Close date: 02 Nov 2026
Categories:
Particle size analysis. Sieving
Committee: ISO/TC 24/SC 4
(Particle characterization)
Origin: ISO
Close date: 10 Nov 2026