Testing
Categories:
Testing. Electrical and electronic
Committee: TC 66
(error)
Origin: IEC
Close date: 08 May 2026
Categories:
Testing. Electrical and electronic
Committee: CLC/TC 66X
("Safety of measuring)
Origin: CENELEC
Close date: 08 May 2026
Categories:
Testing. Non-destructive
Committee: CEN/TC 138
(Non-destructive testing)
Origin: CEN
Close date: 14 May 2026