Electronics

IEC 63567-4 ED1 - Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process
Categories: Semiconductor devices
Committee: TC 47 (error)
Origin: IEC
Close date: 14 Aug 2026
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IEC 60384-1 ED7 - Fixed capacitors for use in electronic equipment - Part 1: Generic specification
Categories: Capacitors
Committee: TC 40 (error)
Origin: IEC
Close date: 21 Aug 2026
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IEC 61076-1 ED3 - Connectors for electrical and electronic equipment – Product requirements – Part 1: Generic specification
Categories: Electromechanical components. Electronic and telecommunications equipment
Committee: TC 48/SC 48B (error)
Origin: IEC
Close date: 28 Aug 2026
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IEC 61076-3 ED3 - Connectors for electrical and electronic equipment – Product requirements – Part 3: Rectangular connectors – Sectional specification
Categories: Electromechanical components. Electronic and telecommunications equipment
Committee: TC 48/SC 48B (error)
Origin: IEC
Close date: 28 Aug 2026
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prEN IEC 61076-1:2026 - Connectors for electrical and electronic equipment - Product requirements - Part 1: Generic specification
Categories: Electromechanical components. Electronic and telecommunications equipment
Committee: CLC/SR 48B (Electrical connectors)
Origin: CENELEC
Close date: 28 Aug 2026
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prEN IEC 61076-3:2026 - Connectors for electrical and electronic equipment - Product requirements - Part 3: Rectangular connectors - Sectional specification
Categories: Electromechanical components. Electronic and telecommunications equipment
Committee: CLC/SR 48B (Electrical connectors)
Origin: CENELEC
Close date: 28 Aug 2026
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ISO/DIS 13682-1 - Laser and laser related equipment — Determination of the properties of ultrashort laser pulses — Part 1: Vocabulary and symbols
Categories: Optoelectronics. Laser equipment
Committee: ISO/TC 172/SC 9 (Laser and electro-optical systems)
Origin: ISO
Close date: 31 Aug 2026
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ISO/DIS 13682-2 - Laser and laser related equipment — Determination of the properties of ultrashort laser pulses — Part 2: Autocorrelation measurement method
Categories: Optoelectronics. Laser equipment
Committee: ISO/TC 172/SC 9 (Laser and electro-optical systems)
Origin: ISO
Close date: 31 Aug 2026
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